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[Test, Experiment, Analysis System] Diode & Transistor Temperature Characteristic Evaluation

It is being introduced for purposes such as reducing operator workload, increasing equipment utilization rates, and data storage!

This system is designed to measure and evaluate the electrical characteristics of semiconductor products such as diodes and transistors under varying temperature and humidity conditions using a constant temperature chamber. It automates measurements and digitizes data by controlling semiconductor parameter analyzers, constant temperature chambers, and various wiring switches via GP-IB from a computer. The introduction of this system leads to improvements in operational efficiency and a reduction in workload. 【Benefits of Implementation】 ■ Improvement in Operational Efficiency - Automation increases operational efficiency (unmanned operation is possible after the test begins) - Expensive equipment can be operated more efficiently ■ Reduction in Workload - Quick automatic measurement of a series of environmental controls enables energy savings - The time products are subjected to harsh environments is minimized *For more details, please refer to the related links or feel free to contact us.

  • Testing Equipment and Devices

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